ellipsometry (Q898774)
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optical technique for characterizing thin films
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | ellipsometry |
optical technique for characterizing thin films |
Statements
Ellipsometry
0 references
Ellipsometry
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Identifiers
1 reference
Sitelinks
Wikipedia(23 entries)
- arwiki قياس إهليلجي
- cswiki Elipsometrie
- dawiki Ellipsometri
- dewiki Ellipsometrie
- enwiki Ellipsometry
- eswiki Elipsometría
- fawiki بیضیسنجی
- frwiki Ellipsométrie
- gawiki Éilipsiméadracht
- huwiki Ellipszometria
- idwiki Elipsometer
- jawiki 偏光解析法
- kowiki 타원계측법
- mkwiki Елипсометрија
- nlwiki Ellipsometrie
- nnwiki Ellipsometri
- ptwiki Elipsometria
- ruwiki Эллипсометрия
- simplewiki Ellipsometry
- slwiki Elipsometrija
- tawiki தளவிளைவு அளவியல்
- ukwiki Еліпсометрія
- zhwiki 橢圓偏振技術
Wikibooks(0 entries)
Wikinews(0 entries)
Wikiquote(0 entries)
Wikisource(0 entries)
Wikiversity(0 entries)
Wikivoyage(0 entries)
Wiktionary(0 entries)
Multilingual sites(1 entry)
- commonswiki Ellipsometry