Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy (Q59181905)
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article published in 2007
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy |
article published in 2007 |
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Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy (English)
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10 December 2007
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91
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24
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243110
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