Dopant profiling and surface analysis of silicon nanowires using capacitance–voltage measurements (Q62401403)
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scientific article published on 15 March 2009
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Dopant profiling and surface analysis of silicon nanowires using capacitance–voltage measurements |
scientific article published on 15 March 2009 |
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Dopant profiling and surface analysis of silicon nanowires using capacitance-voltage measurements (English)
Yu-Chih Tseng
Peidong Yang
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